{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T01:44:23Z","timestamp":1743126263087,"version":"3.40.3"},"publisher-location":"Berlin, Heidelberg","reference-count":10,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540287551"},{"type":"electronic","value":"9783540287568"}],"license":[{"start":{"date-parts":[[2005,1,1]],"date-time":"2005-01-01T00:00:00Z","timestamp":1104537600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2005,1,1]],"date-time":"2005-01-01T00:00:00Z","timestamp":1104537600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2005]]},"DOI":"10.1007\/11550907_140","type":"book-chapter","created":{"date-parts":[[2021,2,12]],"date-time":"2021-02-12T16:24:41Z","timestamp":1613147081000},"page":"887-892","source":"Crossref","is-referenced-by-count":0,"title":["A New Probabilistic Neural Network for Fault Detection in MEMS"],"prefix":"10.1007","author":[{"given":"Reza","family":"Asgary","sequence":"first","affiliation":[]},{"given":"Karim","family":"Mohammadi","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"issue":"1","key":"140_CR1","first-page":"36","volume":"52","author":"B. Murari","year":"2003","unstructured":"Murari, B.: Integrated Nanelectronic Components into Electronic Microsystems. IEEE Trans. on Reliability\u00a052(1), 36\u201344 (2003)","journal-title":"IEEE Trans. on Reliability"},{"key":"140_CR2","unstructured":"Muller, R., Wagner, U., Bernhard, W.: Reliability of MEMS-a methodical approach. In: Proc.11th European symposium on reliability of electron devices, failure physics and analysis, pp. 1657\u20131662 (2001)"},{"key":"140_CR3","unstructured":"Rosing, R., Richardson, A.: Test Support Strategies for MEMS. In: IEEE International Mixed Signal Test Workshop, Whistler, Canada (June 1999)"},{"key":"140_CR4","doi-asserted-by":"crossref","unstructured":"Mir, S., Charlot, B.: On the Integration of Design and Test for chips embedding MEMS. IEEE design and Test of Computers (October-December 1999)","DOI":"10.1109\/54.808204"},{"key":"140_CR5","unstructured":"TIMA Lab research reports (2002-2004), http:\/\/Tima.imag.fr"},{"key":"140_CR6","first-page":"345","volume":"13","author":"S.H. Yang","year":"2000","unstructured":"Yang, S.H., Chen, B.H.: Neural Network Based Fault Diagnosis Using Unmeasurable Inputs. Journal of Artificial Intelligence-PERGAMON\u00a013, 345\u2013356 (2000)","journal-title":"Journal of Artificial Intelligence-PERGAMON"},{"key":"140_CR7","doi-asserted-by":"publisher","first-page":"112","DOI":"10.1007\/s005210200023","volume":"11","author":"M.A. El-Gamal","year":"2002","unstructured":"El-Gamal, M.A.: Genetically Evolved Neural Networks for Fault Classification in Analog Circuits. Journal of Neural Computing & applications\u00a011, 112\u2013121 (2002)","journal-title":"Journal of Neural Computing & applications"},{"key":"140_CR8","doi-asserted-by":"crossref","unstructured":"Asgary, R., Mohammadi, K.: Pattern Recognition and Fault Detection in MEMS. In: Fourth International Conference on Computer Recognition System, Poland, May 2005, pp. 877\u2013884 (2005)","DOI":"10.1007\/3-540-32390-2_103"},{"issue":"5","key":"140_CR9","doi-asserted-by":"publisher","first-page":"764","DOI":"10.1109\/72.317728","volume":"5","author":"R.L. Streit","year":"1994","unstructured":"Streit, R.L., Luginbuhl, T.E.: Maximum Likelihood Training of Probabilistic Neural Network. IEEE Trans. Neural Networks\u00a05(5), 764\u2013783 (1994)","journal-title":"IEEE Trans. Neural Networks"},{"issue":"1","key":"140_CR10","doi-asserted-by":"publisher","first-page":"142","DOI":"10.1109\/43.822626","volume":"19","author":"Z.R. Yang","year":"2000","unstructured":"Yang, Z.R., Zwolinski, M., Chalk, C.D., Williams, A.C.: Applying A Robust Heteroscedastic Probabilistic Neural Network to Analog Fault Detection and Classification. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems\u00a019(1), 142\u2013151 (2000)","journal-title":"IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems"}],"container-title":["Lecture Notes in Computer Science","Artificial Neural Networks: Formal Models and Their Applications \u2013 ICANN 2005"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/11550907_140","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,2,12]],"date-time":"2021-02-12T16:58:26Z","timestamp":1613149106000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/11550907_140"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005]]},"ISBN":["9783540287551","9783540287568"],"references-count":10,"URL":"https:\/\/doi.org\/10.1007\/11550907_140","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2005]]}}}