乐胖代购免代理版

{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,31]],"date-time":"2024-07-31T01:33:39Z","timestamp":1722389619144},"reference-count":46,"publisher":"Wiley","issue":"7","license":[{"start":{"date-parts":[[2017,6,29]],"date-time":"2017-06-29T00:00:00Z","timestamp":1498694400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"funder":[{"name":"ICEBERG","award":["(324356)"]},{"name":"GAUSS","award":["(CUP E52F16002700001)"]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Software Testing Verif & Rel"],"published-print":{"date-parts":[[2017,11]]},"abstract":"Summary<\/jats:title>Software reliability growth models support the prediction\/assessment of product quality, release time, and testing\/debugging cost. Several software reliability growth model extensions take into account the bug correction process. However, their estimates may be significantly inaccurate when debugging fails to fully fit modelling assumptions. This paper proposes debugging\u2010workflow\u2010aware software reliability growth method (DWA\u2010SRGM), a method for reliability growth analysis leveraging the debugging data usually managed by companies in bug tracking systems. On the basis of a characterization of the debugging workflow within the software project under consideration (in terms of bug features and treatment phases), DWA\u2010SRGM pinpoints the factors impacting the estimates and to spot bottlenecks, thus supporting process improvement decisions. Two industrial case studies are presented, a customer relationship management system and an enterprise resource planning system, whose defects span a period of about 17 and 13\u00a0months, respectively. DWA\u2010SRGM revealed effective to obtain more realistic estimates and to capitalize on the awareness of critical factors for improving debugging.<\/jats:p>","DOI":"10.1002\/stvr.1638","type":"journal-article","created":{"date-parts":[[2017,6,29]],"date-time":"2017-06-29T10:02:52Z","timestamp":1498730572000},"source":"Crossref","is-referenced-by-count":16,"title":["Debugging\u2010workflow\u2010aware software reliability growth analysis"],"prefix":"10.1002","volume":"27","author":[{"given":"Marcello","family":"Cinque","sequence":"first","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione Universit\u00e0 degli Studi di Napoli Federico II Naples 80125 Italy"}]},{"given":"Domenico","family":"Cotroneo","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione Universit\u00e0 degli Studi di Napoli Federico II Naples 80125 Italy"}]},{"given":"Antonio","family":"Pecchia","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione Universit\u00e0 degli Studi di Napoli Federico II Naples 80125 Italy"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-2449-1724","authenticated-orcid":false,"given":"Roberto","family":"Pietrantuono","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione Universit\u00e0 degli Studi di Napoli Federico II Naples 80125 Italy"}]},{"given":"Stefano","family":"Russo","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica e delle Tecnologie dell'Informazione Universit\u00e0 degli Studi di Napoli Federico II Naples 80125 Italy"}]}],"member":"311","published-online":{"date-parts":[[2017,6,29]]},"reference":[{"key":"e_1_2_11_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2003.10.024"},{"key":"e_1_2_11_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-39259-7_26"},{"key":"e_1_2_11_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.859230"},{"key":"e_1_2_11_5_1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1020515105175"},{"key":"e_1_2_11_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2005.12.006"},{"key":"e_1_2_11_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2103590"},{"key":"e_1_2_11_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.909777"},{"key":"e_1_2_11_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227095"},{"key":"e_1_2_11_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/WCRE.2012.32"},{"key":"e_1_2_11_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1595808.1595833"},{"key":"e_1_2_11_12_1","unstructured":"Bugzilla defect tracking system.www.bugzilla.org."},{"key":"e_1_2_11_13_1","unstructured":"JIRA Software.www.atlassian.com\/software\/jira."},{"key":"e_1_2_11_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.09.006"},{"key":"e_1_2_11_15_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.03.006"},{"key":"e_1_2_11_16_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.4370030103"},{"key":"e_1_2_11_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"e_1_2_11_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.232177"},{"key":"e_1_2_11_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"},{"key":"e_1_2_11_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.1998.731593"},{"key":"e_1_2_11_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2008.11.840"},{"key":"e_1_2_11_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627370"},{"key":"e_1_2_11_23_1","doi-asserted-by":"crossref","unstructured":"K.Shibata K.Rinsaka andT.Dohi inPISRAT: Proportional Intensity\u2010Based Software Reliability Assessment Tool 13th Pacific Rim International Symposium on Dependable Computing (PRDC 2007) Melbourne Qld. 2007 pp.43\u201352.","DOI":"10.1109\/PRDC.2007.18"},{"key":"e_1_2_11_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/CASE.1992.200165"},{"key":"e_1_2_11_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.895301"},{"key":"e_1_2_11_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.6"},{"key":"e_1_2_11_27_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10009-014-0319-0"},{"key":"e_1_2_11_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2372411"},{"key":"e_1_2_11_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2007.182"},{"key":"e_1_2_11_30_1","doi-asserted-by":"publisher","DOI":"10.1145\/390016.808456"},{"key":"e_1_2_11_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1992.285846"},{"key":"e_1_2_11_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2001.989472"},{"key":"e_1_2_11_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/24.963126"},{"key":"e_1_2_11_34_1","doi-asserted-by":"publisher","DOI":"10.1023\/B:SQJO.0000034709.63615.8b"},{"key":"e_1_2_11_35_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.391"},{"key":"e_1_2_11_36_1","volume-title":"Software Reliability, Measurement, Prediction and Application","author":"Musa J. D.","year":"1987"},{"key":"e_1_2_11_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.909760"},{"key":"e_1_2_11_38_1","doi-asserted-by":"publisher","DOI":"10.1002\/smr.1699"},{"key":"e_1_2_11_39_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-09156-3_33"},{"key":"e_1_2_11_40_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.01.004"},{"key":"e_1_2_11_41_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1998.730872"},{"key":"e_1_2_11_42_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICQR2MSE.2011.5976642"},{"key":"e_1_2_11_43_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2003.1251047"},{"key":"e_1_2_11_44_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2007.04.002"},{"key":"e_1_2_11_45_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICMIT.2006.262333"},{"key":"e_1_2_11_46_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2015.01.001"},{"key":"e_1_2_11_47_1","doi-asserted-by":"publisher","DOI":"10.1142\/1390"}],"container-title":["Software Testing, Verification and Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fstvr.1638","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/stvr.1638","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,30]],"date-time":"2023-09-30T01:33:40Z","timestamp":1696037620000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/stvr.1638"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6,29]]},"references-count":46,"journal-issue":{"issue":"7","published-print":{"date-parts":[[2017,11]]}},"alternative-id":["10.1002\/stvr.1638"],"URL":"https:\/\/doi.org\/10.1002\/stvr.1638","archive":["Portico"],"relation":{},"ISSN":["0960-0833","1099-1689"],"issn-type":[{"value":"0960-0833","type":"print"},{"value":"1099-1689","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,6,29]]}}}