{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,23]],"date-time":"2023-10-23T04:58:30Z","timestamp":1698037110840},"reference-count":16,"publisher":"Wiley","issue":"11","license":[{"start":{"date-parts":[[2007,3,21]],"date-time":"2007-03-21T00:00:00Z","timestamp":1174435200000},"content-version":"vor","delay-in-days":6714,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Systems & Computers in Japan"],"published-print":{"date-parts":[[1988,11]]},"abstract":"Abstract<\/jats:title>Testing in software development is very important since it is the final refining stage before realizing the software to the user and requires a large amount of development resources. In this paper, the time\u2010dependent behavior of the test effort, such as the manpower spent in the testing process, is represented by exponential and Rayleigh functions, and the software reliability growth model is discussed, which includes the test\u2010effort functions. The nonhomogeneous Poisson process is assumed as the stochastic principle describing the software error\u2010detection phenomenon in the testing procedure. Especially, the variance analysis is discussed to determine the significance of the estimation of the test\u2010effort function by the least\u2010square method, as well as the prediction of the test effort invested at an arbitrary testing time. It is shown that the software reliability measure derived from the proposed model is a function of the invested test effort. Not only is the point estimation presented, but also the interval estimation. Examples are shown where the proposed model is applied to the actually observed test data, and the goodness\u2010of\u2010fit is compared with the existing software reliability growth models. As a result, the goodness\u2010of\u2010fit of the proposed model is verified, where the effect of the invested test effort is considered.<\/jats:p>","DOI":"10.1002\/scj.4690191109","type":"journal-article","created":{"date-parts":[[2007,7,7]],"date-time":"2007-07-07T14:48:58Z","timestamp":1183819738000},"page":"87-96","source":"Crossref","is-referenced-by-count":0,"title":["Test effort\u2010dependent software reliability growth models and comparisons of goodness\u2010of\u2010fit"],"prefix":"10.1002","volume":"19","author":[{"given":"Shigeru","family":"Yamada","sequence":"first","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2007,3,21]]},"reference":[{"key":"e_1_2_1_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1982.235728"},{"key":"e_1_2_1_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"e_1_2_1_4_2","doi-asserted-by":"crossref","first-page":"465","DOI":"10.1016\/B978-0-12-266950-7.50028-1","volume-title":"Software reliability research, Statistical Computer Performance Evaluation","author":"Jelinski Z.","year":"1972"},{"key":"e_1_2_1_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1980.230790"},{"key":"e_1_2_1_6_2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220648"},{"key":"e_1_2_1_7_2","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1980.11812"},{"key":"e_1_2_1_8_2","unstructured":"J. D.MusaandK.Okumoto. A logarithmic Poisson execution time model for software reliability measurement Proc. 7th Int. Conf. Software Engineering pp.230\u2013238(1984)."},{"key":"e_1_2_1_9_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.232179"},{"key":"e_1_2_1_10_2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1986.4335332"},{"key":"e_1_2_1_11_2","volume-title":"Repairable Systems Reliability","author":"Ascher H.","year":"1984"},{"key":"e_1_2_1_12_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1978.231521"},{"key":"e_1_2_1_13_2","volume-title":"Applied Regression Analysis","author":"Draper N. R.","year":"1981"},{"key":"e_1_2_1_14_2","doi-asserted-by":"publisher","DOI":"10.1002\/0471725234"},{"key":"e_1_2_1_15_2","volume-title":"Software Reliability Evaluation","author":"Yamada S.","year":"1985"},{"key":"e_1_2_1_16_2","first-page":"80","volume-title":"Technical Report RADC\u2010TR","author":"Brooks W. D.","year":"1980"},{"key":"e_1_2_1_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"}],"container-title":["Systems and Computers in Japan"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fscj.4690191109","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/scj.4690191109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,22]],"date-time":"2023-10-22T03:37:16Z","timestamp":1697945836000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/scj.4690191109"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1988,11]]},"references-count":16,"journal-issue":{"issue":"11","published-print":{"date-parts":[[1988,11]]}},"alternative-id":["10.1002\/scj.4690191109"],"URL":"https:\/\/doi.org\/10.1002\/scj.4690191109","archive":["Portico"],"relation":{},"ISSN":["0882-1666","1520-684X"],"issn-type":[{"value":"0882-1666","type":"print"},{"value":"1520-684X","type":"electronic"}],"subject":[],"published":{"date-parts":[[1988,11]]}}}