{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,28]],"date-time":"2024-08-28T17:10:09Z","timestamp":1724865009163},"reference-count":30,"publisher":"Wiley","issue":"4","license":[{"start":{"date-parts":[[2023,2,21]],"date-time":"2023-02-21T00:00:00Z","timestamp":1676937600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Quality & Reliability Eng"],"published-print":{"date-parts":[[2023,6]]},"abstract":"Abstract<\/jats:title>The classical memory Exponential Weighted Moving Average (EWMA) and Cumulative Sum (CUSUM) control charts (CCs) are important to detect small\u2010to\u2010moderate sizes of shift in the process location and\/or dispersion parameters. To make the memory control chart (CC) more efficient for broad range of shift, the score functions in particular Huber and Bi\u2010square functions are incorporated in the classical memory CCs. These score functions help to formulate the parameters of memory CCs and are called Adaptive EWMA (AEWMA) and Adaptive CUSUM (ACUSUM). The AEWMA and ACUSUM are capable to handle various sizes (i.e., small, moderate, and large) of shift. The aim of this study is to utilize Hampel function as the alternative of the mentioned score functions, and propose a new AEWMA CC, symbolized as AEWMAHample<\/jats:sub>. To develop the proposed AEWMAHample<\/jats:sub>CC, the standard EWMA statistic and Hampel function are incorporated in the classical EWMA CC structure. The proposed AEWMAHample<\/jats:sub>CC is also efficient to handle certain sizes of shift in the process location parameter. Performance evaluation procedures, like average run length is considered for a particular shift. Similarly, the performance comparison index, relative average run length, and extra quadratic loss function are estimated over a range of shift. All these performance measures are calculated from run length (RL) characteristic of the proposed control chart. An algorithm in MATLAB is developed based on Monte Carlo simulation procedure to generate the RLs. Some existing control charts including EWMA, CUSUM, MEC, MCE, , , IACCUSUM, , and are taken for comparison reason. For specific sizes of shift, the proposed AEWMAHample<\/jats:sub>CC reveals the superiority. Besides, to address the practical significance for practitioners and quality engineers, the real\u2010life and simulated data examples are considered.<\/jats:p>","DOI":"10.1002\/qre.3291","type":"journal-article","created":{"date-parts":[[2023,2,21]],"date-time":"2023-02-21T17:41:47Z","timestamp":1677001307000},"page":"1277-1298","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["An adaptive EWMA control chart based on Hampel function to monitor the process location parameter"],"prefix":"10.1002","volume":"39","author":[{"given":"Babar","family":"Zaman","sequence":"first","affiliation":[{"name":"Department of Mathematics College of Science University of Hafr Al Batin Hafr Al Batin Saudi Arabia"}]},{"given":"Syed Zeeshan","family":"Mahfooz","sequence":"additional","affiliation":[{"name":"Department of Computer Science & Engineering University of Hafr Al Batin Hafr Al Batin Saudi Arabia"}]},{"given":"Rashid","family":"Mehmood","sequence":"additional","affiliation":[{"name":"Department of Mathematics, College of Science University of Hafr Al Batin Hafr Al Batin Saudi Arabia"}]},{"given":"Naveed","family":"Khan","sequence":"additional","affiliation":[{"name":"Department of Chemical Engineering University of Hafr Al Batin Hafr Al Batin Saudi Arabia"}]},{"given":"Tajammal","family":"Imran","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering University of Hafr Al Batin Hafr Al Batin Saudi Arabia"}]}],"member":"311","published-online":{"date-parts":[[2023,2,21]]},"reference":[{"key":"e_1_2_12_2_1","first-page":"501","volume-title":"Economic control of quality of manufactured product","author":"Shewhart 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