{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T12:49:27Z","timestamp":1715863767660},"reference-count":32,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2019,1,31]],"date-time":"2019-01-31T00:00:00Z","timestamp":1548892800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"funder":[{"name":"European FEDER program"},{"name":"Spanish Government projects","award":["TEC2011-28302 and TEC2015-68448-R"]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Circuit Theory & Apps"],"published-print":{"date-parts":[[2019,3]]},"abstract":"Summary<\/jats:title>This paper presents a fast background calibration method for comparator offsets in pipeline ADCs and analyzes the practical considerations in a 1.8\u00a0V 0.18\u00a0\u03bcm 100Msps pipeline ADC with 15\u2010bit resolution (74\u00a0dB\u2010Signal\u2010to\u2010noise plus Distortion Ratio [SNDR]). A self\u2010repairing (SR) thermometer\u2010to\u2010binary encoder is developed to deal with malfunctioning in presence of high comparator offsets greater than one\u2010half least\u2010significant bit (LSB). In this situation, the effective thresholds between two adjacent comparators could be inverted leading to a faulty behavior with conventional architectures. The proposed solution allows a dynamic assignment of the calibration code associated to each comparator improving convergence speed. As demonstrator, its application to a 15\u2010bit pipeline ADC using a novel calibrated dynamic\u2010latch comparator (DLC) with internal threshold reference generation and no preamplifier is presented, showing a reduction on the total power consumption of 22% with respect to a design without calibration targeting the same specifications.<\/jats:p>","DOI":"10.1002\/cta.2594","type":"journal-article","created":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T03:41:21Z","timestamp":1548992481000},"page":"333-349","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Fast adaptive comparator offset calibration in pipeline ADC with self\u2010repairing thermometer to binary encoder"],"prefix":"10.1002","volume":"47","author":[{"ORCID":"http:\/\/orcid.org\/0000-0001-5272-5802","authenticated-orcid":false,"given":"Antonio Jos\u00e9","family":"Gin\u00e9s","sequence":"first","affiliation":[{"name":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE\u2010CNM, (CSIC, Universidad de Sevilla) Seville Spain"}]},{"given":"Eduardo Jos\u00e9","family":"Peral\u00edas","sequence":"additional","affiliation":[{"name":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE\u2010CNM, (CSIC, Universidad de Sevilla) Seville Spain"}]},{"given":"Cristina","family":"Aledo","sequence":"additional","affiliation":[{"name":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE\u2010CNM, (CSIC, Universidad de Sevilla) Seville Spain"}]},{"given":"Adoraci\u00f3n","family":"Rueda","sequence":"additional","affiliation":[{"name":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE\u2010CNM, (CSIC, Universidad de Sevilla) Seville 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