Introduction:

The NIST X-ray Photoelectron Spectroscopy (XPS) Database gives easy access to the energies of many photoelectron and Auger-electron spectral lines.  Resulting from a critical evaluation of the published literature, the database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.  A highly interactive program allows the user to search by element, line type, line energy, and many other variables.  Users can easily identify unknown measured lines by matching to previous measurements.